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음이온 기반 멤리스터의 최신 기술동향 및 이슈

The Latest Trends and Issues of Anion-based Memristor

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초록

Recently, memristor (anion-based memristor) is referred to as the fourth circuit element which resistance state can be gradually changed by the electric pulse signals that have been applied to it. And the stored information in a memristor is non-volatile and also the resistance of a memristor can vary, through intermediate states, between high and low resistance states, by tuning the voltage and current. Therefore the memristor can be applied for analogue memory and/or learning device. Usually, memristive behavior is easily observed in the most transition metal oxide system, and it is explained by electrochemical migration motion of anion with electric field, electron scattering and joule heating. This paper reports the latest trends and issues of anion-based memristor.

Abstract

Recently, memristor (anion-based memristor) is referred to as the fourth circuit element which resistance state can be gradually changed by the electric pulse signals that have been applied to it. And the stored information in a memristor is non-volatile and also the resistance of a memristor can vary, through intermediate states, between high and low resistance states, by tuning the voltage and current. Therefore the memristor can be applied for analogue memory and/or learning device. Usually, memristive behavior is easily observed in the most transition metal oxide system, and it is explained by electrochemical migration motion of anion with electric field, electron scattering and joule heating. This paper reports the latest trends and issues of anion-based memristor.

참고문헌 (24)

  1. D. B. Strukov, "The missing memristor found", Nature, 453(7191), pp.80~ (2008)
  2. M. Y. Zhuravlev, "Giant Electroresistance in Ferroelectric Tunnel Junctions", Phys. Rev. Lett, 94(24), pp.246802~ (2005)
  3. M. D. Stiles, "Anatomy of spin-transfer torque", Phys. Rev. B, 66(1), pp.014407~ (2002)
  4. R. Waser, "Redox-Based Resistive Switching Memories-Nanoionic Mechanisms, Prospects, and Challenges", Adv. Mater., 21(25-26), pp.2632~ (2009)
  5. S. -H. Lee, "Highly scalable nonvolatile and ultra-low-power phase-change nanowire memory", Nat. Nanotechnol, 2(10), pp.626~ (2007)
  6. O. Auciello, "The Physics of Ferroelectric Memories", Phy. Today, 51(7), pp.22~ (1998)
  7. S. Mathews, "Ferroelectric Field Effect Transistor Based on Epitaxial Perovskite Heterostructures", Science, 276(5310), pp.238~ (1997)
  8. J. Lee, "GeSbTe deposition for the PRAM application", Appl. Surf. Sci, 253(8), pp.3969~ (2007)
  9. Z. Li, "Domain-wall dynamics driven by adiabatic spin-transfer torques", Phys. Rev. B, 70(2), pp.024417~ (2004)
  10. A. Sawa, "Resistive switching in transition metal oxides", Mater. Today, 11(6), pp.28~ (2008)
  11. D. -H. Kwon, "Atomic structure of conducting nanofilaments in TiO2 resistive switching memory", Nat. Nanotechnol, 5(2), pp.148~ (2010)
  12. B. J. Choi, "Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition", J. Appl. Phys, 98(3), pp.033715~ (2005)
  13. H. S. Lee, "A new route to the Mott-Hubbard metal-insulator transition : Strong correlations effects in Pr0. 7Ca0. 3MnO3", Sci. Rep, 3, pp.1704~ (2013)
  14. 최득성, "DRAM 소자의 PCT 신뢰성 측정 후 비정상 AlXOY 층 형성에 의해 발생된 불량 연구", 마이크로전자 및 패키징학회지, 25(3), pp.31~36 (2018), 한국마이크로전자및패키징학회
  15. 최채형, "멀티레벨 낸드 플래쉬 메모리 프로그램 포화 영역에서의 IPD 층에 트랩된 전하의 손실 효과에 의한 문턱 전압 저하 특성에 대한 연구", 마이크로전자 및 패키징학회지, 24(3), pp.47~52 (2017), 한국마이크로전자및패키징학회
  16. E. Linn, "Complementary resistive switches for passive nanocrossbar memories", Nat. Mater, 9(5), pp.403~ (2010)
  17. M. -J. Lee, "A fast, high-endurance and scalable nonvolatile memory device made from asymmetric Ta2O5-x", TaO2-x bilayer structures, 2011, pp.10(8), 625~
  18. W. Lee, "Resistance switching behavior of atomic layer deposited SrTiO3 film through possible formation of Sr2Ti6O13 or Sr1-Ti11O20 phases", Sci. Rep, 6, pp.20550~ (2016)
  19. H. -S. Lee, "Tunneling Electroresistance Effect with Diode Characteristic for Cross-Point Memory", ACS Appl. Mater. Interfaces, 8(24), pp.15476~ (2016)
  20. W. Lee, "High Current Density and Nonlinearity Combination of Selection Device Based on TaOx", TiO2, ACS Nano, pp.2012, 6(9)[DOI]
  21. C. -Y. Lin, "Attaining resistive switching characteristics and selector properties by varying forming polarities in a single HfO2-based RRAM device with a vanadium electrode", Nanoscale, 9(25), pp.8586~ (2017)
  22. S. Pi, "Memristor crossbar arrays with 6-nm half-pitch and 2-nm critical dimension", Nat. Nanotechnol, 14(1), pp.35~ (2019)
  23. S. Choi, "SiGe epitaxial memory for neuromorphic computing with reproducible high performance based on engineered dislocations", Nat. Mater, 17(4), pp.335~ (2018)
  24. V. K. Sangwan, "Multi-terminal memtransistors from polycrystalline monolayer molybdenum disulfide", Nature, 554(7693), pp.500~ (2018)

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