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인공지능 기반 EL 이미지의 태양전지 및 모듈의 결함검출 연구

A Study on the Detection of Defects in Solar Cells and Modules in EL Images based on Artificial Intelligence

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주제분류기타공학

초록

Currently, investment is being made in renewable energy for the transition to a low-carbon economy and society, and interest in solar energy is also increasing. In addition to the technological development of solar cells and photovoltaic (PV) modules, research in the field of convergence with artificial intelligence technology is being actively conducted. Defects occurring in the manufacturing process of solar cells and modules can be detected through electroluminescence (EL) measurements. In this study, we propose an artificial intelligence technology that can automatically detect defects in cells and modules in real time using EL image data of solar cells and modules in the manufacturing process. For EL defect detection, we propose an algorithm with high suitability in terms of speed and accuracy by applying deep learning-based object detection models and comparing and evaluating detection performance. In the case of the YOLO (you only look once) algorithm, which belongs to a one-step detector, it learns In the case of the YOLO (you only look once) algorithm, which belongs to a one-step detector, it learns through an optimization process to find information about the defect and the location information of the corresponding failure in the form of a bounding box, and then detects the failure based on this information. The introduction of a deep learning-based defect detection model in the manufacturing process is expected to reduce the time required for defect detection by solar cell and PV module manufacturers and contribute to productivity improvement.

Abstract

Currently, investment is being made in renewable energy for the transition to a low-carbon economy and society, and interest in solar energy is also increasing. In addition to the technological development of solar cells and photovoltaic (PV) modules, research in the field of convergence with artificial intelligence technology is being actively conducted. Defects occurring in the manufacturing process of solar cells and modules can be detected through electroluminescence (EL) measurements. In this study, we propose an artificial intelligence technology that can automatically detect defects in cells and modules in real time using EL image data of solar cells and modules in the manufacturing process. For EL defect detection, we propose an algorithm with high suitability in terms of speed and accuracy by applying deep learning-based object detection models and comparing and evaluating detection performance. In the case of the YOLO (you only look once) algorithm, which belongs to a one-step detector, it learns In the case of the YOLO (you only look once) algorithm, which belongs to a one-step detector, it learns through an optimization process to find information about the defect and the location information of the corresponding failure in the form of a bounding box, and then detects the failure based on this information. The introduction of a deep learning-based defect detection model in the manufacturing process is expected to reduce the time required for defect detection by solar cell and PV module manufacturers and contribute to productivity improvement.

참고문헌 (9)

  1. The Basic Plan of Long Term Electricity Supply and Demand, "Ministry of Trade, Industry and Energy", ~ (2020)
  2. Song, Y., "The Analysis of Growth and Electrical Characteristics of Micro-crack with Thermal Effect in PV Module", 2011 Korean Institute of Electrical Engineers Conference, pp.1318~1319 (2011)
  3. 송영훈, "결정질 태양전지의 Micro-crack 패턴에 따른 PV모듈의 전기적 특성에 관한 연구", 전기학회논문지, 61(3), pp.407~412 (2012), 대한전기학회
  4. Köntges, M., "The Risk of Power Loss in Crystalline Silicon based Photovoltaic Modules due to Micro-cracks", Solar Energy Materials and Solar Cells, 95(4), pp.1131~1137 (2011)
  5. Dhimish, M., "Novel Photovoltaic Micro Crack Detection Technique", IEEE Transactions on Device and Materials Reliability, 19(2), pp.304~312 (2019)
  6. Redmon, J., "You Only Look Once: Unified, Real-time Object Detection", Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp.779~788 (2016)
  7. 이용환, "객체 검출을 위한 CNN과 YOLO 성능 비교 실험", 반도체디스플레이기술학회지, 19(1), pp.85~92 (2020), 한국반도체디스플레이기술학회
  8. 강지수, "교통 영상 빅데이터 처리를 위한 Yolo 기반 광원 객체 탐지", 융합정보논문지, 10(8), pp.40~46 (2020), 중소기업융합학회[DOI]
  9. Girshick, R., "Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation", Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp.580~587 (2014)

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