태양광 패널 고장 진단기기를 위한 소자 특성 및 Mux 회로 제어 방법에 대한 연구
Characteristics of Semiconductor Device and Multiplexer Control Method for Photovoltaic Panel Fault Diagnosis
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초록
In Korea, the annual installed PV capacity has increased over the years. However, the supply of photovoltaic panel fault diagnosis techniques for efficient management is stil insufficient. Thus, many research groups and companies have been developing photovoltaic panel fault diagnostic equipment to measure I-V characteristics (1500 VMax. and 50 AMax.) and calculate the power efficiency of photovoltaic panels to quickly detect faults. In these methods, the capacitor load is used to measure the I-V curve of the photovoltaic panel. In addition, a MOSFET is used for stable I-V measurement and Multiplexing, and a high sampling ADC is used for simultaneous and quick (6 s) multi-channel measurements.
Abstract
In Korea, the annual installed PV capacity has increased over the years. However, the supply of photovoltaic panel fault diagnosis techniques for efficient management is stil insufficient. Thus, many research groups and companies have been developing photovoltaic panel fault diagnostic equipment to measure I-V characteristics (1500 VMax. and 50 AMax.) and calculate the power efficiency of photovoltaic panels to quickly detect faults. In these methods, the capacitor load is used to measure the I-V curve of the photovoltaic panel. In addition, a MOSFET is used for stable I-V measurement and Multiplexing, and a high sampling ADC is used for simultaneous and quick (6 s) multi-channel measurements.
참고문헌 (7)
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