본문 바로가기
KERD
논문KCI 등재

Automatic Detection Method for Mura Defects on Display Films Using Morphological Image Processing and Labeling

0

조회

0

다운로드

1

인용

0

참고문헌

키워드

초록

This paper proposes a new automatic detection method to inspect mura defects on display film surface using morphological image processing and labeling. This automatic detection method for mura defects on display films comprises 3 phases of preprocessing with morphological image processing, Gabor filtering, and labeling. Since distorted results could be obtained with the presence of non-uniform illumination, preprocessing step reduces illumination components using morphological image processing. In Gabor filtering, mura images are created with binary coded mura components using Gabor filters. Subsequently, labeling is a final phase of finding the mura defect area using the difference between large mura defects and values in the periphery. To evaluate the accuracy of the proposed detection method, detection rate was assessed by applying the method in 200 display film samples. As a result, the detection rate was high at about 95.5%. Moreover, the study was able to acquire reliable results using the Semu index for luminance mura in image quality inspection.

Abstract

This paper proposes a new automatic detection method to inspect mura defects on display film surface using morphological image processing and labeling. This automatic detection method for mura defects on display films comprises 3 phases of preprocessing with morphological image processing, Gabor filtering, and labeling. Since distorted results could be obtained with the presence of non-uniform illumination, preprocessing step reduces illumination components using morphological image processing. In Gabor filtering, mura images are created with binary coded mura components using Gabor filters. Subsequently, labeling is a final phase of finding the mura defect area using the difference between large mura defects and values in the periphery. To evaluate the accuracy of the proposed detection method, detection rate was assessed by applying the method in 200 display film samples. As a result, the detection rate was high at about 95.5%. Moreover, the study was able to acquire reliable results using the Semu index for luminance mura in image quality inspection.

참고문헌 (9)

  1. New Standard: Definition of Measurement Index (SEMU) for Luminance Mura in FPD, "SEMI", SEMI, ~ (2002)
  2. Y.C Lee, "LCD Mura Detection Based on Accumulated Differences and Multi-resolution Background Subtraction" (2009)
  3. C. J. Lu, "Automatic defect inspection for LCDs using singular value decomposition", International Journal of Advanced Manufacturing Technology, 25, pp.53~61 (2005)
  4. W. C. Li, "Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection", IEEE Transactions on Industrial Informatics, 7(1), pp.136~147 (2011)
  5. X. Bi, "A New Mura Defect inspection way for TFT-LCD using level set method", IEEE Signal processing letters, 16(4), pp.311~314 (2009)
  6. L. C. Chen, "Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and 'just noticeable difference' quantification strategies", Measurement Science and Technology, 19, pp.1~10 (2008)
  7. R. C. Gonzalez, "Digital Image Processing" (2008), Prentice Hall
  8. J. R. Movellan, "Tutorial on Gabor Filters", ~ (2008)
  9. Definition of measurement index (SEMU) for luminance Mura in FPD image quality inspection, "SEMI", ~, pp.SEMI D31-1102 (2002)

관련 논문AI추천

이 간행물의 다른 논문 (15건)